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Materials Characterization
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Materials Characterization

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Materials Characterization
Yang Leng

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Introduction to Microscopic and Spectroscopic Methods
This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.
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  • Editie:PDF met Adobe DRM  Meer informatie
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  • ISBN: 9780470822999
  • Auteur: Yang Leng
  • Uitgave: John Wiley & Sons
  • Jaar van uitgave: 2009
  • Taal: Engels
  • Artikelnummer: 58063698
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€ 86,99
ebook
Ebook direct te downloaden
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